Ключевые слова: presentation, HTS, REBCO, coated conductors, doping, fabrication, IBAD process, PLD process, high rate process, doping, coils pancake, current-voltage characteristics, uniformity, Jc/B curves, angular dependence, critical current, magnetic field dependence, mechanical properties, thickness dependence, fatigue behavior, stress effects, strain effects
Ключевые слова: HTS, ErBCO, coated conductors, fabrication, TFA-MOD process, IBAD process, X-ray diffraction, growth rate
Ключевые слова: chalcogenide, coated conductors, films, IBAD process, substrate Hastelloy, PLD process, buffer layers, X-ray diffraction, microstructure, resistive transition, critical temperature, upper critical fields, irreversibility fields, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: presentation, HTS, REBCO, coated conductors, fabrication, IBAD process, PLD process, status, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, tensile tests, strain effects, stress effects, bending process, compression, delamination, magnets sextupole, conduction cooled systems, coils pancake, test results
Selvamanickam V., Wosik J., Sun S., Sandra J.S., Paidpilli M., Yerraguravagari V., Suarez-Villagran M*2.
Yoshida Y., Iijima Y., Furuse M., Kakimoto K., Fujita S., Yoshida T., Daibo M., Ohsugi M., Hirata W.
Ключевые слова: HTS, YBCO, GdBCO, RCE-CDR process, MOCVD process, PLD process, IBAD process, coated conductors, tapes, measurement technique, measurement setup, mechanical properties, tensile tests, critical caracteristics, critical current, stress effects, strain effects, bending process, comparison
Ключевые слова: HTS, YBCO, doping effect, coated conductors, IBAD process, RABITS process, template layers, films, substrate SrTiO3, PLD process, comparison, microstructure, electron diffraction, distribution, X-ray diffraction, lattice parameter, magnetization, temperature dependence, critical current density, distribution, experimental results
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: HTS, YGdBCO, doping effect, pinning centers artificial, coated conductors, PLD process, IBAD process, substrate Hastelloy, X-ray diffraction, lattice parameter, microstructure, magnetization, temperature dependence, critical temperature, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, critical current density, angular dependence, experimental results, in-field performance
Ключевые слова: HTS, EuBCO, coated conductors, fabrication, growth rate, high rate process, PLD process, IBAD process, substrate Hastelloy, doping effect, defects columnar, nanoscaled effects, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: HTS, EuBCO, doping, PLD process, IBAD process, coated conductors, films epitaxial, fabrication, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, anisotropy, pinning
Ключевые слова: thin films, PLD process, substrate SrTiO3, GdBCO, coated conductors, IBAD process, ion irradiation, irradiation effects, defects columnar, microstructure, critical caracteristics, critical current, angular dependence, anisotropy, critical current density, n-value, magnetic field dependence, X-ray diffraction, experimental results, HTS, YBCO
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